半导体分立器件的失效分析及预防措施  

Failure analysis and preventive measures for semi-conductive separated apparatus

作　　者：夏远飞[1] 刘勇[1] 

机构地区：[1]空军第一航空学院,河南信阳464000

出　　处：《中国测试》2012年第6期87-90,共4页China Measurement & Test

摘　　要：为研究过电应力对半导体分立器件可靠性的影响,以国产ZL20螺栓形整流二极管为例,建立整流二极管基本失效率模型,揭示半导体分立器件性能和可靠性的主要影响因素,提出预防半导体分立器件失效的措施。试验结果表明:给出的ZL20螺栓形整流二极管基本失效率模型反映了其失效规律,可以应用于工程实践。In order to understand the effect of electrical overstress to the reliability of semi conductive separated apparatuses,this paper introduced main effective factors on capability and reliability of semi-conductive separated apparatuses by setting up ZL20 bolt-shaped diode as a basic model.It also put forward the measures to prevent invalidation of semi-conductive separated apparatuses.The experimental results show that the basic invalidation rate of model ZL20 bolt shaped diode obey the given invalidation rule,which can be applied to engineering practice.

关 键 词：过电应力 失效分析 半导体分立器件 可靠性 模型 

分 类 号：TN313.5[电子电信—物理电子学] O213.2[理学—概率论与数理统计]