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机构地区:[1]成都工业学院电气与电子工程系,成都611730 [2]四川广播电视大学教学处,成都610073
出 处:《微电子学》2012年第6期842-845,共4页Microelectronics
摘 要:随着器件尺寸的不断缩小,电路复杂度日益增加,电源已成为微处理器等需要精确供能的系统能否较快发展的主要制约因素之一。由于功耗是诸多不确定变量的函数,因此,芯片功率及宏功率分析最为准确的方法是基于制造过程和工作负荷变化的统计分析方法。与静态时序模型可以表示为一个线性规范化的高斯分布不同,统计分析是一个依赖于过程变量、工作量波动的复杂指数函数,这对统计能量分析是一个独特的挑战。提出了一种研究方法,通过研究开关电源的静态漏电功耗和动态功率统计分布,揭示宏功率分析与芯片功率分析的特征和相关性。实验结果表明,该方法对开关电源的研究是可行的。With ever shrinking device size and growing circuit complexity, power has become the limiting factor in microprocessor design. Since power dissipation is a function of many variables with uncertainty, the most accurate representation of chip power or macro power is a statistical distribution subject to process and workload variation, instead of a single number for the average or worst-case power. Unlike statistical timing models that can be represented as a linear canonical form of Gaussian distributions, the exponential dependency of leakage power on process variables, as well as the complex relationship between switching power and workload fluctuations, present unique challenges in statistical power analysis. A comprehensive case study on the statistical distribution of dynamic switching power and static leakage power was made to demonstrate the characterization and correlation methods for macro-level and chip-level power analysis.
分 类 号:TN70[电子电信—电路与系统]
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