红外敏感器加速寿命试验方法研究  

On Accelerated Life Test Method of High-power Infrared Sensor

作　　者：宣兆龙[1] 程泽[1] 刘亚超[1] 

机构地区：[1]军械工程学院,石家庄050003

出　　处：《装备环境工程》2012年第6期44-46,50,共4页Equipment Environmental Engineering

摘　　要：红外敏感技术能够有效探测复杂背景环境中的目标,为了获得红外敏感器的长储寿命规律,利用提高温度应力进行加速寿命试验是一种重要方法。基于威布尔分布假设,研究了红外敏感器加速寿命试验的关键技术,并提出了加速寿命试验程序。The thermal target under complex background environment can be detected effectively by infrared detection technology. In order to acquire the life information of infrared sensor, accelerated life test （ALT） was conducted with increased temperature stress. Weibull distribution function was applied to study some key technologies of ALT of infrared sensor. The procedure of the accelerated life test was put forward.

关 键 词：加速寿命试验 红外敏感器 评估 

分 类 号：TJ760.623[兵器科学与技术—武器系统与运用工程] TJ765.333