光学石英晶体条纹缺陷表征  

Analysis of Radiated Striae in Quartz Crystal

作　　者：张绍锋[1] 张璇[1] 刘巨澜[1] 孙志文[1] 刘小丰[1] 

机构地区：[1]烁光特晶科技有限公司,北京100018

出　　处：《人工晶体学报》2012年第6期1578-1580,共3页Journal of Synthetic Crystals

基　　金：北京市自然科学基金(2122021)资助项目

摘　　要：本文对光学石英晶体进行辐照,将通常仅在脉理仪下才能呈现的条纹缺陷着色,加以观察和分析。对比辐照后条纹形貌和脉理仪下观察图样,确定辐照可以使条纹缺陷呈现;通过辐照后的着色机理,确定条纹缺陷是由杂离子在晶格中造成的形变产生;通过对比无条纹缺陷区域和条纹缺陷区域化学成分,确定进入晶格的Al3+是引起人造光学石英晶体中条纹缺陷的主要原因。The striae pattern can be observed in radiated optical quartz with eyes,which can be observed only using striae-checking apparatus before.Contrasting striae observed in polarized light and striae pattern appeared by radiation,we can conclude that striae appear color because of radiation.Crystal lattice distortion brings about stress,and form striae under visible light.Analyzing composition by ICP instrument,higher impurity content Al3＋ can be detected in striae area contrast to striae-free area.

关 键 词：石英 条纹 辐照 

分 类 号：TN213[电子电信—物理电子学]