串联电容法校准高值电容的不确定度分析  

Uncertainty Analysis of High Capacitance Calibration by Series Capacitor Method

作　　者：吴康[1] 李亚琭[1] 刘民[1] 

机构地区：[1]北京东方计量测试研究所,北京100086

出　　处：《宇航计测技术》2012年第5期41-44,共4页Journal of Astronautic Metrology and Measurement

摘　　要：分析与计算了利用高准确度自动电桥AH2700A及标准电容Agilent 16380C(1#F)为标准,采用串联电容法校准10μF～1mF高值电容的测量结果不确定度。经过不确定度分析,10μF电容的测量不确定达到0.02%,100μF电容的测量不确定达到0.1%,1mF电容的测量不确定达到0.6%。The article analysis and calculate uncertainty of 10μF - lmF high capacitance＇ s meas- urement results by series capacitor method which standard are high accuracy bridge AH2700A and stand- ard capacitor Agilent 16380C（ 1 μF）. Via uncertainty analysis, measurement uncertainty of capacitor of 10 μF is 0.02% ,measurement uncertainty of capacitor of 100 μF is 0.1%, the measurement uncertainty of capacitor of lmF is 0. 6%.

关 键 词：串联电容法 高值标准电容 不确定度分析 

分 类 号：TB971[一般工业技术—计量学]