电喷雾电离源测定印刷线路板阵列离子阱的分析性能  

Analytical Performance of Printed Circuit Board Ion Trap Array Mass Analyzer with Electrospray Ionization

作　　者：储艳秋[1] 肖育[1] 凌星[1] 丁传凡[1] 

机构地区：[1]复旦大学化学系激光化学研究所,上海200433

出　　处：《分析化学》2013年第1期152-158,共7页Chinese Journal of Analytical Chemistry

基　　金：国家科技支撑计划(No.2009BAK60B03)资助项目

摘　　要：电喷雾电离源(ESI)测定了印刷线路板材料制成的四通道PCB矩形离子阱中一个通道的的分析性能。结果表明,质谱峰检测到的离子信号的种类和强度明显受到离子动能的影响。当离子动能低于18 eV,则得到的质谱峰主要为精氨酸Arg离子(m/z 175.2),增加其离子动能则Arg离子(m/z 175.2)易碎裂,发生脱胍基、脱水等反应。在正弦波的射频模式下测定了离子质量隔离和离子质量选择激发,以SWIFT缺口频率为50～60 kHz,75～85 kHz和130～145 kHz分别隔离了m/z 175.2,117.3和71.8的离子;用频率为55、80和135 kHz的正弦波(振幅为1.0 V)选择激发弹出了m/z 175.2,117.3和71.8的离子。在氦气气氛下,频率为102 kHz正弦波可以使得Arg离子(m/z 175.2)发生碎裂,得到m/z 157.2,130.3和117.3碎片离子。电流积分法的测定结果表明,在256 kHz共振激发时离子测定效率为46.3%,在边界弹出时,离子测定效率约为9.7%。The analytical performance of rectilinear ion trap array made up of printed circuit board material has been determined. The experimental results indicate that the intensity of ions determined was affected dramatically by ion kinetic energy, as in 18 eV, the arginine （Arg） ion （m/z 175.2） dominated in the mass spectrum. The ion trap array can perform multiple sample ion storage, mass-selected ion isolation, ion ejection and collision induce dissociation. The ions of m/z 175.2, 117.3 and 71.8 were isolated by stored wave form inverse Fourier transform （SWIFI＇） notch 50-60 kHz, 75-85 kHz, 130-145 kHz, respectively. The ions of m/z 175.2, 117.3 and 71.8 were ejected selectively using 55 kHz, 80 kHz and 135 kHz sine wave. In helium gas, the fragment ions of m/z 157.2, 130.3 and 117.3 were obtained by the fragmentaion reaction of Arg precursor ion （m/z 175.2 ） using 102 kHz sine wave. The ion detection efficiency was determined by electric current integration method, which indicated that the ion detection efficiency was estimated to be 46.3% in 256 kHz AC resonance ejection and was about 9.7% in boundary ejection.

关 键 词：离子阱阵列 印刷线路板 高通量 电喷雾电离源 分析性能 

分 类 号：TN41[电子电信—微电子学与固体电子学]