光电检测技术应用半导体激光管的新进展  

Recent Advances in Semiconductor Laser Diodes for Applications in Optoelectronic Measuring Techniques

作　　者：缪家鼎[1] 

机构地区：[1]浙江大学,浙江杭州310022

出　　处：《半导体光电》1991年第4期337-341,共5页Semiconductor Optoelectronics

摘　　要：综述了近年来在光电测厚、测速、测距、测浓度、测表面质量等方面应用半导体激光管的新进展。这些成就展示了采用半导体激光管后对仪器小型化、仪器进入生产线监控过程的前景。Recent advances in Semiconductor laser diodes for applica- tions,in measurements of thickness,distance,velocity,optical surface and gas concentration by optoelectronic methods are reviewed.These advances show a bright future of miniaturization of in-process optoelectronic instru- ments and sensors.

关 键 词：半导体激光管 光电检测 

分 类 号：TN248.4[电子电信—物理电子学]