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作 者:GAO Jinchun XIE Gang
机构地区:[1]School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China [2]School of Infrmation and Communication Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China
出 处:《Chinese Journal of Electronics》2012年第3期559-565,共7页电子学报(英文版)
基 金:Manuscript Received May 2011; Accepted Nov. 2011. This work is supported by the National Natural Science Foundation of China (No.50677004) and Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications.
摘 要:Dust contamination is one of the major causes of electrical contact failure in the electronic system. This paper describes the characteristics of electric charges carried by dust particles and their effects on connector failure. A Millikan testing method was used for measuring the electric charges. The results show that the variation )f electric charges carried by dust particles is located in a band region, and the trend of charges can be expressed as a third order equation. The morphology and surface seem to be the major factors which influence the electric charge. It is found that dust particles carry negative charges or posi- tive charges, these particles will be attracted to both elec- tric contact surfaces in connector respectively~ and thereby increasing the probability of connector failure. The selec- tive deposition of particles was found on electric contact surface. The failed connectors were investigated by us- ing SEM/EDS (Scanning electron microscope and Energy dispersive X-ray spectroscopy) and protection from dust particles was recommended.
关 键 词:Connector failure Electric charge Dustparticles Contamination.
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