EDXRF法检测纸张及其墨迹微量元素  

The Measurement of Trace Element for Paper and It Painting by XRF Method

作　　者：杨明太[1] 袁莉[1] 戴长松 

机构地区：[1]中国工程物理研究院,四川绵阳621900 [2]绵阳市公安局刑警支队,四川绵阳621000

出　　处：《核电子学与探测技术》2012年第12期1353-1355,共3页Nuclear Electronics & Detection Technology

摘　　要：在司法案件中,物证材料是证明案情的客观实在、证实犯罪、使犯罪嫌疑人认罪伏法的有力武器。本文报告了用能量色散X射线荧光光谱(EDXRF)法检测司法案件纸张及其墨迹微量元素的方法。该方法用能量色散X射线荧光光谱仪测量送检物的特征X射线谱,求得各送检物中各微量元素特征X射线的相对强度,通过数据分析比对进行同一性认定。The material evidence is pithiness weapon of proving case ,confirming delict and making suspect pec- cavi at justice case. The method that trace elements of paper and painting of case were analyzed by EDXRF is reported. The characteristic X - ray spectrum of delivered materials was measured by EDXRF, and the relative intensity of the characteristic X - ray was calculated. The identity cognizance was done by the data analyzing.

关 键 词：X射线荧光光谱法 纸张 墨迹 微量元素 

分 类 号：D918.93[政治法律—法学]