基于机器视觉的微片状物厚度检测  

Detecting Thickness of Micro Flakes Based on Computer Vision

作　　者：王中飞[1] 林茂松[2] 彭勇[1] 褚晓龙[1] 燕发文[1] 

机构地区：[1]西南科技大学计算机科学与技术学院,四川绵阳621000 [2]西南科技大学信息工程学院,四川绵阳621000

出　　处：《计算机测量与控制》2013年第1期36-38,共3页Computer Measurement &Control

基　　金：国防基础科研资助项目(项目文号:869)

摘　　要：针对片状颗粒厚度检测的实际需求,结合机器视觉、图像处理和嵌入式技术,设计与实现了一套基于高性能ARM11的微片状颗粒厚度检测系统。该系统以QT和S3C6410为软硬件平台,提出了利用轮廓提取和最小矩形边界框相结合的方法计算片状颗粒厚度。结果表明,该检测系统具有处理速度快,测量精度高和成本低廉等优点,满足了对颗粒厚度测量的需求。In view of the actual demand to the thickness detecting of flakes, with the combination of computer vision, image processing and embedded technology, a detecting system is designed and realized which is based on the microprocessor of ARMll. The system uses QT and S3C6410 for its software and hardware platform and proposes a new method to calculate the thickness of flakes. The result indicates that the system has some advantages, such as the processing speed, high accuracy and low cost, and meets the requirements of detecting the thickness of flakes.

关 键 词：嵌入式系统 机器视觉 图像处理 厚度检测 

分 类 号：TP391.8[自动化与计算机技术—计算机应用技术]