ITER导体总体气密性检测系统的真空抽气与漏率标定  

Vacuum pumping and leak calibration for the global tightness test system of ITER conductor

作　　者：韩鹏[1] 武玉[1] 王小明[1] 刘华军[1] 郭亮[1] 蔡登刚[1] 许成成[1] 

机构地区：[1]中科院等离子体物理研究所,安徽合肥230031

出　　处：《真空》2013年第1期48-51,共4页Vacuum

基　　金：科技部国际热核聚变实验堆(ITER)计划专项(No.0859733531)

摘　　要：介绍ITER导体总体检漏系统布置,对检漏系统的粗真空抽气时间和高真空抽气时间进行具体计算,其中高真空抽气时间计算运用两种数学方法:特别积分法和Runge-Kutta法。介绍了检漏系统标定的重要仪器之一的标准漏孔,最后叙述检漏系统的标定实验并计算出此系统的最小可检漏率Qmin=1.4×10-11Pa.m3/s,满足导体漏率检测要求。The arrangement of the global tightness test system of ITER conductor was introduced, and specific calculation about rough pumping time and high vacuum pumping time for the system was carried out. Especially, two kinds of mathematical methods were used to calculate the high vacuum pumping time, which are Particular Integral and Runge-Kutta. The standard leak was used as one of the most important instruments for calibrating the system detectable leak rate. Finally, the test was performed about calibrating the tightness test system, then the minimum detectable leak rate of the system Qmin=1.4×10^-11Pa·m^3/s was calculated, which meet the requirement of tightness test.

关 键 词：检漏 抽气时间 标准漏孔 漏率标定 

分 类 号：TB71[一般工业技术—真空技术]