基于FPGA和FT245的芯片功能测试装置的设计与实现  

Design of IC Chips Functional Test Equipment Based on FPGA and FT245

作　　者：凌伟[1] 杨燕姣[1] 

机构地区：[1]电子测试技术国家重点实验室仪器科学与动态测试教育部重点实验室,中北大学太原030051

出　　处：《科学技术与工程》2012年第36期9976-9979,9993,共5页Science Technology and Engineering

基　　金：国家自然科学基金(60871041)资助

摘　　要：设计芯片功能测试装置,以FPGA为控制单元,利用FT245实现FPGA与上位机的通信。上位机发送测试数据,然后采集被测芯片的输出响应并分析。与理论上正确的数据进行比较,得出结论。对于模拟芯片设计了A/D和D/A转换模块,调试的结果表明,测试装置可完成对常用芯片的功能测试。A device based on FPGA and FT245 for testing chips was designed. FPGA as the control core unit of the testing system is regarded. FT245 is used to achieve communications between FPGA and PC . PC sends down the test codes and then collects and analyses the output response datum. The conclusion can be got by compa- ring the collected datum from PC with theoretically correct datum. For analog chips, the A/D and D/A conversion control modules are designed. The real test and the whole task eventually have be completed.

关 键 词：FPGA FT245 数据采集 

分 类 号：TN431.2[电子电信—微电子学与固体电子学]