基于单光弹调制器的米勒矩阵测量技术  

Measurement Technique for the Mueller Matrix Based on a Single Photo-Elastic Modulator

作　　者：曹绍谦[1,2] 步扬[1] 王向朝[1] 李思坤[1] 汤飞龙[1,2] 李中梁[1] 

机构地区：[1]中国科学院上海光学精密机械研究所信息光学与光电技术实验室,上海201800 [2]中国科学院大学,北京100049

出　　处：《光学学报》2013年第1期122-129,共8页Acta Optica Sinica

基　　金：国家自然科学基金(60938003;61205102;61275207);科技部国际科技合作项目(2011DFR10010)资助课题

摘　　要：针对已有米勒矩阵测量方法的不足,提出了一种基于单光弹调制器的米勒矩阵测量技术,给出了米勒矩阵测量优化算法及系统参数两步校准法。该技术通过两步校准法对系统参数进行校准测量,利用优化算法计算得到待测样品的米勒矩阵。实验结果表明,待测1/4波片相位延迟量测量值为90.4185°,误差在标称偏差λ/300以内,快轴方位角测量值为0.2348°,误差在最大旋转误差0.4°以内。同快轴方位角为0°的1/4波片标准米勒矩阵相比,待测1/4波片米勒矩阵各元素最大相对误差的直接测量值和间接测量值分别为1.97%和0.83%,均小于最大相对误差的模拟仿真值2.11%。通过提高旋转台的读数精度和减小相位延迟量的标称偏差,可以进一步减小米勒矩阵各元素的最大相对误差。A measurement technique for the Mueller matrix based on a single photo-elastic modulator is proposed to improve the current measurement methods.An optimization algorithm and a two-step procedure of system parameter calibration are also presented.System parameters are calibrated by the two-step calibration procedure.Then,the Mueller matrix of the measured sample is obtained with the optimization algorithm.The experimental results show that the retardation and the fast axis angle of the measured quarter-wave plate are 90.4185° and 0.2348°,respectively.The corresponding errors are less than the retardation tolerance λ/300 and the maximum rotation error 0.4°,respectively.Compared to the standard Mueller matrix of a quarter-wave plate whose fast axis angle is set at 0°,the maximum relative errors of each element of the Mueller matrix of the measured quarter-wave plate are 1.97% and 0.83% with direct and indirect measurement method,respectively.Both errors are less than 2.11%,which is the simulation value of the maximum relative error.Decreasing the retardation tolerance or improving the precision of the rotation stage can diminish the maximum relative error of each element of the Mueller matrix.

关 键 词：测量 偏振 米勒矩阵 单光弹调制器 校准 

分 类 号：O436.3[机械工程—光学工程]