含晶界场离子显微镜——原子探针试样的制备技术  

Technique on Preparing Test Samples for the Use of Field Ion Microscope Atomprobe Containing Crystal Boundary

作　　者：张俊峰[1] 朱逢吾[2] 

机构地区：[1]辽宁工学院基础科学部,辽宁锦州121001 [2]北京科技大学,北京100083

出　　处：《辽宁工学院学报》2000年第1期1-2,16,共3页Journal of Liaoning Institute of Technology(Natural Science Edition)

基　　金：国家自然基金资助项目! (编号 5 9771 0 1 8)

摘　　要：应用电子显微镜和脉冲抛光技术 ,成功控制了晶界在场离子显微镜—原子探针试样中的位置 ,使其处于场离子显微镜—原子探针的有效分析范围内。获得铁素体不锈钢含晶界场离子显微镜—原子探针试样的制备条件 ,制成含晶界 Fe- 1The application of electroscope and pulse polishing technology enables the field ion microscope atomprobe (FIM AP) on the sample to locate itself successfully the crystal boundary, moreover, makes the dialing subatomprobe in the range to be efficiently analyzed. Thus, the preparation of conditions for samples to be tested are obtained for field ion microscope atomprobe, to test stainless steel′s crystal boundary of ferrite, resulting in Fe—17 Cr, an alloy sample containing crystal boundary are worked out.

关 键 词：场离子显微镜 原子探针 晶界 试样 金属材料 

分 类 号：TG115.215[金属学及工艺—物理冶金] TH742.4[金属学及工艺—金属学]