THz激光F-P片旋转透过率研究  

Research on THz Laser Transmittance of Rotated F-P Plate

作　　者：张延超[1] 费非[1] 王静[1] 田兆硕[1] 付石友[1] 

机构地区：[1]哈尔滨工业大学(威海)信息光电子研究所,山东威海264209

出　　处：《现代科学仪器》2012年第6期49-51,共3页Modern Scientific Instruments

摘　　要：在不同角度下测量THz激光透过率对于材料性质研究及THz参数测量具有重要意义。本文在实验上研究了旋转F-P片的THz激光透过率,分别在不同角度下测量了硅片和锗片的THz激光透过率,测量角度范围0.175-2.967 rad,旋转步长0.175rad,得到的THz激光透过率具有一定的周期性,实验验证了旋转F-P片测量THz激光透过率在测量THz激光波长等应用的可行性。Measurement of material transmittance on THz laser at different angle is of important significance to study material properties.In this paper,rotated Fabry-Perot plate transmittance properties had been studied experimentally,and different angle transmittance of silicon slice and germanium wafer was achieved respectively.With angular range of 0.1752.967rad and rotated step 0.175rad,the obtained transmittance of THz laser has a characteristic of certain periodic.The rotated Fabry-Perot plate transmittance measurement experiments verify the application feasibility of measuring THz laser wavelength.

关 键 词：旋转F-P THz激光 透过率 

分 类 号：TN24[电子电信—物理电子学]