Development of front-end readout electronics for silicon strip detectors  被引量:1

Development of front-end readout electronics for silicon strip detectors

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作  者:千奕 苏弘 孔洁 董成富 马晓莉 李小刚 

机构地区:[1]Institute of Modern Physics,Chinese Academy of Sciences

出  处:《Chinese Physics C》2013年第1期91-94,共4页中国物理C(英文版)

基  金:Supported by National Natural Science Foundation of China(10735060 and 11005135);Important Direction Project of CAS Knowledge Innovation Program(KJCX2-YW-N27)

摘  要:Front-end readout electronics have been developed for silicon strip detectors at our institute. In this system an Application Specific Integrated Circuit (ASIC) ATHED is used to realize multi-channel energy and time measurements. The slow control of ASIC chips is achieved by parallel port and the timing control signals of ASIC chips are implemented with the CPLD. The data acquisition is carried out with a PXI-DAQ card. The software has a user-friendly GUI developed with LabWindows/CVI in the Windows XP operating system. The test results show that the energy resolution is about 1.14% for alpha at 5.48 MeV and the maximum channel crosstalk of the system is 4.60%. The performance of the system is very reliable and is suitable for nuclear physics experiments.Front-end readout electronics have been developed for silicon strip detectors at our institute. In this system an Application Specific Integrated Circuit (ASIC) ATHED is used to realize multi-channel energy and time measurements. The slow control of ASIC chips is achieved by parallel port and the timing control signals of ASIC chips are implemented with the CPLD. The data acquisition is carried out with a PXI-DAQ card. The software has a user-friendly GUI developed with LabWindows/CVI in the Windows XP operating system. The test results show that the energy resolution is about 1.14% for alpha at 5.48 MeV and the maximum channel crosstalk of the system is 4.60%. The performance of the system is very reliable and is suitable for nuclear physics experiments.

关 键 词:front-end readout electronics ASIC PXI-DAQ 

分 类 号:TL81[核科学技术—核技术及应用]

 

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