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作 者:郭志英 席识博 朱京涛 赵屹东 郑雷 洪才浩 唐坤 杨栋亮 崔明启
机构地区:[1]Institute of High Energy Physics,Chinese Academy of Sciences [2]Institute of Precision Optical Engineering,Physics Department,Tongji University
出 处:《Chinese Physics C》2013年第1期129-132,共4页中国物理C(英文版)
基 金:Supported by National Natural Science Foundation of China(11075176, 10435050)
摘 要:Three ultra-short-period W/B4C multilayers (1.244 nm, 1.235 nm and 1.034 nm) have been fabricated and used for polarization measurement at the 4BTB Beamline at the Beijing Synchrotron Radiation Facility (BSRF). By using the rotating analyzer ellipsometry method, the linear polarization degree of light emerging from this beamline has been measured and the circular polarization evaluated for 700-860 eV. The first soft X-ray magnetic circular dichroism measurements are carried out at BSRF by positioning the beamline aperture out of the plane of the electron storage ring.Three ultra-short-period W/B4C multilayers (1.244 nm, 1.235 nm and 1.034 nm) have been fabricated and used for polarization measurement at the 4BTB Beamline at the Beijing Synchrotron Radiation Facility (BSRF). By using the rotating analyzer ellipsometry method, the linear polarization degree of light emerging from this beamline has been measured and the circular polarization evaluated for 700-860 eV. The first soft X-ray magnetic circular dichroism measurements are carried out at BSRF by positioning the beamline aperture out of the plane of the electron storage ring.
关 键 词:polarization measurement MULTILAYERS soft X-ray magnetic circular dichroism (XMCD)
分 类 号:TL503[核科学技术—核技术及应用]
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