边界扫描测试技术发展综述  

A Survey on Development of Boundary Scan Techonology

作　　者：刘九洲[1] 王健[1] 

机构地区：[1]中国人民解放军93325部队

出　　处：《电光与控制》2013年第2期46-49,69,共5页Electronics Optics & Control

摘　　要：随着大规模和超大规模集成电路的应用越来越广泛,迫切需要提出新的测试方法。边界扫描测试技术解决了数字电路,特别是超大规模集成电路的测试问题,受到了人们越来越多的关注。概述了边界扫描测试技术的基本原理,对边界扫描测试技术应用比较广泛的几个标准内容进行了对比和总结;在测试算法方面,阐述了当前国内外应用比较广泛的一些算法及其优缺点;在应用领域方面,分析了国内外取得的主要应用成果;最后,在总结当前研究现状的基础上,预测了未来在新标准的研究、远程测试技术、测试方法集成等5个方面的发展趋势,为国内同行业了解边界扫描技术的现状与未来发展提供借鉴。As the application of Large Scale Integrated （LSI） circuits and Very Large Scale Integrated （VLSI） circuits, the new test method is needed for circuit testing. Boundary scan technology can solve the problem, especially for VLSI circuit testing. The principle of boundary scan is summarized. The standards of boundary scan are overviewed. Some widely used testing algorithms and their advantages and disadvantages are described. The main achievements on the application of boundary scan are analyzed. In the end, the development trends of new standard research, remote testing, and testing method etc. are predicted, which may provide a reference for one to understand the present and future of the boundary scan technology.

关 键 词：边界扫描 大规模集成电路 电路测试技术 综述 

分 类 号：V271.4[航空宇航科学与技术—飞行器设计] TN407[电子电信—微电子学与固体电子学]