一种基于伪失效寿命的LED可靠性快速评价方法  

Rapid Reliability Evaluation Method of LED Based on Pseudo-failure Lifetime

作　　者：郭伟玲[1] 樊星[1] 崔德胜[1] 吴国庆[1] 俞鑫[1] 

机构地区：[1]北京工业大学光电子技术省部共建教育部重点实验室,北京100124

出　　处：《发光学报》2013年第2期213-217,共5页Chinese Journal of Luminescence

基　　金：国家科技支撑计划(2011BAE01B14)资助项目

摘　　要：提出一种快速评价LED可靠性的有效方法。通过测试LED样品的伪失效寿命,结合Minitab软件进行数据分析,确定全部样品的伪失效寿命服从二参数的威布尔分布。通过计算威布尔分布尺度参数,比较不同样品的尺度参数来评价产品的可靠性。该方法对LED的可靠性评价和寿命预测有一定的参考价值。An efficient and rapid reliability evaluation method of LED has been proposed.The pseudo-failure lifetime is tested and the lifetime data is analyzed by Minitab.The results show that the pseudo-failure lifetime of all samples are Weibull distribution.The reliability evaluation of LED products are made by comparing the scale parameters of Weibull distribution.This method has a certain reference value to reliability evaluation and life prediction of LED.

关 键 词：发光二极管 定时截尾试验 伪失效寿命 威布尔分布 

分 类 号：TN364.2[电子电信—物理电子学]