利用少数相关位的SoC测试数据压缩方法  

Test data compression of system-on-chip (SoC) using few relevant bits

作　　者：欧阳一鸣[1] 黄贵林[1] 梁华国[2] 谢涛[1,3] 黄正峰[2] 

机构地区：[1]合肥工业大学计算机与信息学院,合肥230009 [2]合肥工业大学电子科学与应用物理学院,合肥230009 [3]美国圣地亚哥州立大学计算机科学系,圣地亚哥ca92182

出　　处：《电子测量与仪器学报》2013年第1期76-82,共7页Journal of Electronic Measurement and Instrumentation

基　　金：国家自然科学基金(61274036;61106038);安徽高校省级自然科学研究重点(KJ2010A269);安徽省科技攻关(11010202190)资助项目

摘　　要：随着系统芯片集成度的提高，芯片所需要的测试数据也越来越庞大，为解决由此带来的自动测试设备（ATE）存储容量和带宽之间的矛盾，提出了一种基于数据块之间极少数相同位或极少数不同位的测试数据压缩及解压算法。根据数据块之间这些极少数相同位或极少数不同位，低频次数据块与参与Huffman编码的高频次数据块取得相关性联系，并通过一定的方式共享其较短的哈夫曼码字，从而精简Huffman编码状态表，达到测试数据压缩的目的。与同类经典方案相比，实验表明该方案的平均压缩率提高了6．11％-22．89％，且算法简单。With the improvement of ystem-on-chip integration, large amount of test data for the chip is required increas- ingly. To solve the contradiction between the storage capacity and bandwidth of automatic test equipment （ATE）, a new method of test data compression/decompression is proposed based on few same or different bits between different blocks. Based on the low frequency data blocks associated with the high frequency data blocks which participated in the Huffman encoding by few same or different bits, and shared shorter Huffman codeword with them in a certain way, thereby the state table of Huffman coding could be simplified and the purpose of test data compression is reached. According to the ex- perimental results, the compression ratio increases by 6.11% to 22.89% compared with that of other schemes, and also the proposed method is simple.

关 键 词：相关位 哈夫曼 测试数据压缩 

分 类 号：TP302[自动化与计算机技术—计算机系统结构]