检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
作 者:TU YouPing WANG Qian HE Jie LI Xiao DING LiJian
机构地区:[1]Beijing Key Laboratory of High Voltage & EMC(North China Electric Power University) [2]School of Automation and Information Engineering,Xi'an University of Technology [3]China Electric Power Research Institute
出 处:《Chinese Science Bulletin》2013年第7期677-682,共6页
基 金:supported by the National Natural Science Foundation of China (Grant Nos. 50577021,50877025);the Doctor Program Foundation of Institutions Higher Education of China (Grant Nos. 200800790004)
摘 要:The AC aging characteristics and mechanism of ZnO varistors have been widely concerned for a long time.In this paper,accelerated aging test of ZnO varistors was carried out based on the "ten degrees and a half" rule,power loss and thermally stimulated current(TSC) of samples were tested during each aging stage.The test results show that with the increasing of aging time,the power loss increases,the trapped charges increase and the trap level becomes deeper.In addition,the increase of power loss and the increase of trapped charge with the aging time have the same trend.A preliminary analysis shows that the migration of interstitial zinc ions will change the space charge distribution and decrease the Schottky barrier height to cause the change of the trap level.The AC aging characteristics and mechanism of ZnO varistors have been widely concerned for a long time. In this paper, ac- celerated aging test of ZnO varistors was carried out based on the "ten degrees and a half" rule, power loss and thermally stimulated current (TSC) of samples were tested during each aging stage. The test results show that with the increasing of aging time, the power loss increases, the trapped charges increase and the trap level becomes deeper. In addition, the increase of power loss and the increase of trapped charge with the aging time have the same trend. A preliminary analysis shows that the migration of interstitial zinc ions will change the space charge distribution and decrease the Schottky barrier height to cause the change of the trap level.
关 键 词:ZNO压敏电阻器 TSC AC 中年 功率损耗 空间电荷分布 加速老化 老化时间
分 类 号:TQ174.756[化学工程—陶瓷工业] TM714.3[化学工程—硅酸盐工业]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.49