非晶硒平板探测器点状脱模分析  

Analysis of point desquamation in amorphous selenium flat panel detector

作　　者：李松强[1] 张晔[1] 

机构地区：[1]中国中医科学院望京医院放射科,北京100102

出　　处：《中国医学装备》2013年第2期21-23,共3页China Medical Equipment

摘　　要：目的:通过理论、临床实践和实验室检测3种方法介绍非晶硒平板探测器伪影的产生,分析伪影产生的原因,探讨解决产生伪影的方法,延长非晶硒平板探测器的使用寿命。方法:通过实际工作和实验室检测伪影,针对同一幅图像分析其伪影产生的原因。结果:非晶硒平板探测器伪影产生的原因是点状脱膜所致,选择1000个胸部平片做临床试验,在原有的照相条件下增加照相剂量,可使散在小面积高密度伪影有所减少。结论:为了提高医学影像诊断的正确率,减少被检者的辐射剂量需更换新的平板探测器。Objective： The ghost effect of amorphous selenium fiat panel detector （a-Se FPD） was studied by theory, clinical practice, and experiments. In order to increase the life of a-Se FPD, the causes of ghost effect as well as corresponding solutions were discussed. Methods： Ghost effects were detected through experiment and clinical practice, and the causes of ghost in a same image were analyzed. Results： The ghost effect in a-Se FPD is caused by point desquamation of selenium film. According to an analysis of a thousand chest images in clinic, an increasing of x-ray doses can reduce the number of dispersed small size ghosts. Conclusion： In order not to affect clinical diagnosis, replacing the a-Se FPD with a new one is necessary.

关 键 词：探测器 脱膜 环境条件 投照条件 

分 类 号：R812[医药卫生—放射医学]