High-contrast imaging for weakly diffracting specimens in coherent diffraction imaging  

作　　者：潘兴臣 Suhas P. Veetil 刘诚 林强 朱健强 

机构地区：[1]Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences [2]Department of Physics,Amity University Dubai,Dubai 345019,United Arab Emirates

出　　处：《Chinese Optics Letters》2013年第2期39-41,共3页中国光学快报（英文版）

基　　金：supported by the One Hundred Person Project of Chinese Academy of Sciences under Grant No.1104331-JR0

摘　　要：Coherent diffraction imaging （CDI） and ptychography techniques bypass the difficulty of having high- quality optics in X-ray microscopy by using a numerical reconstruction of the image that is obtained by inverting the diffracted intensity recorded by a charge-coupled device array. However, the reconstruction of the image from the intensity data obtained from a weakly diffracting specimen is known to be difficult because of the obvious reduction in signal-to-noise ratio （SNR）. In this case, the specimen only slightly modifies the probe diffraction pattern~ resulting in difficulty in the identification of the detailed structure of the specimen from the reconstructed image because of the poor contrast and sharpness of the image. To address this situation, a modification in the image retrieval algorithms used in the iterative reconstruction of the image is suggested. This modification should double the presence of high spatial frequencies in the diffraction pattern to enhance the contrast and edge detection in existing imaging techniques.Coherent diffraction imaging （CDI） and ptychography techniques bypass the difficulty of having high- quality optics in X-ray microscopy by using a numerical reconstruction of the image that is obtained by inverting the diffracted intensity recorded by a charge-coupled device array. However, the reconstruction of the image from the intensity data obtained from a weakly diffracting specimen is known to be difficult because of the obvious reduction in signal-to-noise ratio （SNR）. In this case, the specimen only slightly modifies the probe diffraction pattern~ resulting in difficulty in the identification of the detailed structure of the specimen from the reconstructed image because of the poor contrast and sharpness of the image. To address this situation, a modification in the image retrieval algorithms used in the iterative reconstruction of the image is suggested. This modification should double the presence of high spatial frequencies in the diffraction pattern to enhance the contrast and edge detection in existing imaging techniques.

关 键 词：Diffraction patterns Edge detection Image retrieval Imaging techniques Interferometry Iterative methods 

分 类 号：O436.1[机械工程—光学工程]