大功率LED加速寿命试验方法研究进展  

Progress in Accelerated Life Testing Methods for High Power Light Emitting Diode

作　　者：李文涛[1] 白虹[1] 肖海清[1] 陶自强[1] 王宏伟[1] 付艳玲[1] 于红梅[1] 魏玮[1] 

机构地区：[1]中国检验检疫科学研究院,北京100123

出　　处：《检验检疫学刊》2013年第1期70-72,共3页Journal of Inspection and Quarantine

摘　　要：简要介绍了大功率LED寿命的定义、测试技术及加速寿命试验方法的最新进展。在理论研究方面,一些学者建立了LED寿命的数学模型,给出了具体推导LED寿命的数学公式。在试验方法研究方面,常见的加速条件有温湿度试验、温度循环试验、大电流加速试验、温度和大电流复合加速试验等等。通过加速寿命试验,能够较快地预测LED产品在工作环境中的寿命。因此,加速寿命试验是对大功率LED照明产品长期使用可靠性进行评价的有效途径。The definition for the lifetime of high power light emitting diode （ LED）, the testing methods of lifetime and the accelerated life testing methods were reviewed. The theory of life calculation for high power LED was stud-ied. Several mathematical models for the LED lifetime were derived under various accelerated stresses. The mathe-matical formula for deriving the LED lifetime was given. The most commonly used accelerated stresses include tem-perature and moisture, testing method, high and low temperature cycle, high electrical currents, high temperature combining with high electrical currents etc. The life of LED in normal working condition can be rapidly doped out by accelerated life test methods. Therefore, accelerated life test method is an efficient method for the assessment of the long-term durability of high power LED.

关 键 词：LED 加速寿命 

分 类 号：TN312.8[电子电信—物理电子学]