双间隙双耦合口输出回路冷测模拟方法  

Cold test simulation method for double-gap output circuit with double coupling apertures

作　　者：葛萌[1,2] 王勇[1] 

机构地区：[1]中国科学院电子学研究所,高功率微波源与技术重点实验室,北京100190 [2]中国科学院研究生院,北京100049

出　　处：《强激光与粒子束》2013年第3期675-679,共5页High Power Laser and Particle Beams

基　　金：国家自然科学基金项目(10905032)

摘　　要：根据微波网络理论,将单耦合口输出回路的冷测模拟物理模型进行扩展,使其适用于双耦合口回路。并在此模型的基础上提出了计算双间隙双耦合口输出回路间隙阻抗频率特性的冷测模拟方法。运用该方法,结合软件仿真,计算分析了某S波段双间隙双耦合口输出腔,分别得到该回路工作在2π模式下的阻抗实部与虚部的频率特性,并对计算结果的合理性作了论证。最后通过将计算结果与采用场分析法及散射参数方法得到的结果进行比较和分析,进一步验证该冷测模拟方法的可靠性。Based on microwave net theory, a cold test simulation model of double-gap output circuit with double coupling apertures was developed from that of output circuit with single coupling aperture. A computation method for gap impedance was also developed based on this model, by which the real part and imaginary part of the gap impedance can be both obtained. Mean- while, a double-gap cavity with double coupling apertures for an S band klystron was simulated to show how to compute the gap impedance and external quality factor of the output cavity with this simulation method, and the computed result is verified to be reasonable in theory. The computed result was analyzed and compared with those obtained with the field analysis method and the scattering parameter of output circuit, confirming the reliability of this cold test simulation method.

关 键 词：速调管 双间隙输出腔 双耦合口 间隙阻抗 

分 类 号：TN122[电子电信—物理电子学]