石英晶体测试系统中DDS信号源设计  

Design of DDS Source Used in the Measurement of Quartz Crystal Unit

作　　者：陈南[1] 李东[1] 王艳林[1] 

机构地区：[1]北京信息科技大学仪器科学与光电工程学院,北京100192

出　　处：《电子科技》2013年第3期66-68,共3页Electronic Science and Technology

基　　金：北京市教委面上基金资助项目(km201110772004)

摘　　要：针对π网络石英晶体参数测试系统,采用以STM32F103ZET6型ARM为MCU控制DDS产生激励信号。该测试系统相对于传统的PC机测试系统具有设备简单、操作方便,较之普通单片机测试系统又具有资源丰富、运算速度更快等优点。AD9852型DDS在ARM控制下能产生0～100 MHz扫频信号,经试验数据分析得到信号精度达到0.5×10-6,基本满足设计要求。该系统将以其小巧、快速、操作方便、等优点被广泛采用。This paper puts forward the measurement of quartz crystal unit in π network, which uses ARM chip STM32F103ZET6 as the MCU to control DDS in order to generate the stimulus signals. This measurement unit is simpler in structure and operation than the traditional PC measurement unit, and is more abundant in resources and faster than the ordinary SCM measurement unit. The DDS chip AD9852 will generate the signal of 0 - 100 MHz sweep sine signal in the control of ARM, and by analyzing the data of measurement we can come to the conclusion that the precision of the signal is up to 0. 5 × 10^-6, which meets the design requirements. This unit may find widely applications due to the advantage of being compact, fast, and easy in operation.

关 键 词：石英晶体 DDS AD9852 STM32F103ZET6 

分 类 号：TN74[电子电信—电路与系统]