沉淀法制备片状、球状、柱状纳米掺铟氧化锌及其表征  

Preparation and characterization of lamellar, spherical,hexagonal columnar indium-doped nano ZIO by precipitation method

作　　者：朱奕漪[1] 段学臣[1] 段文杰[1] 程亚娟[1] 蒋波[1] 

机构地区：[1]中南大学材料科学与工程学院,长沙410083

出　　处：《粉末冶金材料科学与工程》2013年第1期59-65,共7页Materials Science and Engineering of Powder Metallurgy

基　　金：长沙市科技计划资助项目(K0902131-11);国家科技部中小企业创新基金资助项目(11C26214302851)

摘　　要：采用沉淀法,以Zn(Ac)2.2H2O和InCl3为反应物制备不同形状的纳米掺铟氧化锌(ZIO)。通过X射线衍射(XRD)和能谱分析(EDS)确定In可进入ZnO晶格,且ZIO晶化度随In掺杂量的升高而降低。铟掺杂量为0.5%、1%(原子分数)的ZIO粉体显微粒度分别为20 nm、50 nm,由激光衍射粒度分析可知,后者的均一性更好、中位径更小。在透射电镜(TEM)和扫描电镜(SEM)下观察薄片状、类球状、六棱柱状的ZIO,并对不同形貌的ZIO形核机理进行探讨。Indium-doped ZIO with different morphologies were prepared by the precipitation method using Zn （Ac） 2·H2O and InC13 as raw materials. XRD and EDS measurements confirm the incorporation of the In3＋into the crystalline lattice of ZnO, and ZIO Crystalline reduces with increasing In3＋ doping concentration. Microscopic particle size of indium-doped ZnO samples at 0.5% and 1% In3＋/Zn2＋molar ratio are 20nm, 50nm, respectively. Laser diffraction particle size analysis indicates that the latter＇s median diameter is lower, and more evenly distributed. Transmission electron microscopy （TEM） and scanning electron microscopy （SEM） measurements show that lamellar, spherical, hexagonal columnar-like ZIO crystals, whose shapes result from the type of precipitants, and the nucleation mechanisms of ZIO with different morphologies are also discussed.

关 键 词：ZIO 沉淀法 In掺杂 粒度 

分 类 号：TB383.1[一般工业技术—材料科学与工程]