CCD成像电子学单元光电参量测试系统  

Photoelectric parameters testing system for CCD imaging electronics unit

作　　者：孙景旭[1] 刘则洵[1] 万志[1] 李宪圣[1] 李葆勇[1] 任建伟[1] 

机构地区：[1]中国科学院长春光学精密机械与物理研究所,吉林长春130033

出　　处：《应用光学》2013年第2期289-294,共6页Journal of Applied Optics

基　　金：国家"863"高技术研究发展计划项目(863-2-5-1-138)

摘　　要：针对空间光学相机重要组成部分的CCD成像电子学单元的光电参量测试需求,介绍了CCD成像电子学单元光电参量测试必要性,提出了对CCD成像电子学单元光电参量进行系统测试的试验方案,并设计、研制了测试装置。对于该装置进行了系统调试与标定,得到单色仪波长定标系数为1.003 29,并对CCD成像电子学单元辐射性能测试中积分球的稳定性及均匀性进行了测试,测试结果满足要求。通过标准探测器标定待测探测器,得到待测探测器的相对光谱响应度。整套装置满足测试要求。According to the testing requirements for photoelectric parameters of CCD imaging e- lectronics unit, as an important part in space optical cameras, the necessity for testing the pho- toelectric parameters of the CCD imaging electronics unit was introduced, the testing scheme was proposed, and the testing device was designed and developed. The device was debugged and calibrated, and a monochromator wavelength calibration coefficient of 1. 003 29 was ob- tained. Moreover, the stability and the uniformity of the integrating sphere in radiation prop- erties testing of CCD imaging electronics unit were conducted, and the results met the de- mands. Through the calibration for the detector by the standard detector, the relative spectral responsivity of the detector was got. The whole device met the testing requirements.

关 键 词：CCD成像电子学单元 光电参量 辐射性能 波长定标 相对光谱响应度 

分 类 号：TN386.5[电子电信—物理电子学]