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作 者:吕涛[1,2] 张景旭[1] 付东辉[1] 陈小云[1] 刘杰[1]
机构地区:[1]中国科学院长春光学精密机械与物理研究所,吉林长春130033 [2]中国科学院研究生院,北京100039
出 处:《应用光学》2013年第2期308-312,共5页Journal of Applied Optics
摘 要:为测量某项目中经过投影物镜观察到的胶片位置处的亮度均匀性,设计采用了成像式亮度测量方法,该方法能够获得整个辐照面的相对亮度分布,较传统的采用光辐射计、光电池等采点取样测量方法便捷经济,采用成像式亮度测量方法测量得到的不均匀度为±4.24%,与采用光辐射计测量得到的不均匀度±3.92%基本一致,相对误差仅为8.16%,该方法可以推广应用于太阳模拟器均匀性检测及场馆均匀照明检测等方面。In order to measure the luminance uniformity through the projection lens at the posi- tion of the film, an image luminance measurement method was used. The relative brightness distribution of the whole irradiated surface was obtained by using the image luminance meas- urement method which was more convenient and economical than the traditional method by u- sing light radiometers or photocells. The non-uniformity measured by image luminance meas- urement method was ; 4.24;, while the non-uniformity measured by light radiometers was ±3.92;, and the relative error was only 8.16%. This method can be applied to solar simulator uniformity measurements and venues uniform illumination detections.
分 类 号:TN206[电子电信—物理电子学] TH741[机械工程—光学工程]
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