基于辐射衰减的IRFPA非均匀性校正  

Non-uniformity Correction of IRFPA Based on the Radiation Attenuation

作　　者：李满良[1,2,3] 吴钦章[1] 曹晓伟[1] 

机构地区：[1]中国科学院光电技术研究所 [2]中国科学院大学 [3]中国人民解放军63610部队

出　　处：《光电工程》2013年第2期123-129,共7页Opto-Electronic Engineering

基　　金：国家863高技术项目(G107302)

摘　　要：针对机动红外测量系统单点非均匀性校正效果不佳、两点非均匀性校正制约条件多的难点,提出了基于辐射衰减的IRFPA(红外焦平面阵列)非均匀性校正新方法。该方法利用辐射衰减片使IRFPA获得不同辐射响应,实现非均匀性两点校正和分段两点校正。分段两点校正通过建立衰减倍率和IRFPA灰度的响应曲线,反演计算任意辐射所处的响应段落,实现了无需定标黑体即可进行分段两点校正。实验结果表明,基于辐射衰减的非均匀性校正效果优于常规方法,在低背景辐射测量条件下校正均匀性提高50%,具有操作简便和环境适应性强的特点。For a motorized infrared measurement system single-point non-uniformity correction results are poor and two-point non-uniformity correction is restricted by many factors, a new non-uniformity correction method is put forward based on radiation attenuation. The method uses different attenuator to produce Infrared Focal Plane Array （IRFPA） response to achieve the two-point correction and the segmented two-point correction. The segmented two-point correction by the establishment of the decay rate and the IRFPA gray response curve can calculate any radiation response, and then the two-point correction finishes in the segment without prior measurement calibration source radiation. The experimental results show that the method is superior to conventional correction methods, and improves the uniformity about 50% under low radiation background. At the same time, the new correction methods have many advantages, such as environmental adaptability and simple operation.

关 键 词：辐射衰减 非均匀性校正 IRFPA 辐射测量 

分 类 号：TN215[电子电信—物理电子学]