An analytical model for the polarization of synchrotronradiation in a soft X-ray region  

作　　者：席识博 崔明启 朱京涛 杨栋亮 徐伟 刘利娟 郭志英 赵佳 

机构地区：[1]Institute of High Energy Physics,Chinese Academy of Sciences [2]Institute of Precision Optical Engineering,Physics Department,Tongji University [3]Beijing University of Technology and Business

出　　处：《Chinese Physics C》2013年第3期113-117,共5页中国物理C（英文版）

基　　金：Supported by National Natural Science Foundation of China (11075176)

摘　　要：Conventionally, the polarization of a synchrotron soft X-ray beam is measured through a polarimeter based on multilayer optical elements. The major drawback of the traditional approach is the difficulty in comparing different configurations due to the misalignment of each incident angle. In this paper, a new analytical model, based on the variation of reflectivity for different incident angles, is established to facilitate the extraction of important polarization-related information, i.e. angular distribution of polarization components, a tiny change of the direction of azimuth rotation axis of polarizer, etc.Conventionally, the polarization of a synchrotron soft X-ray beam is measured through a polarimeter based on multilayer optical elements. The major drawback of the traditional approach is the difficulty in comparing different configurations due to the misalignment of each incident angle. In this paper, a new analytical model, based on the variation of reflectivity for different incident angles, is established to facilitate the extraction of important polarization-related information, i.e. angular distribution of polarization components, a tiny change of the direction of azimuth rotation axis of polarizer, etc.

关 键 词：soft X-ray POLARIZATION multilayer polarizer stokes vector 

分 类 号：O572.211[理学—粒子物理与原子核物理]