65 m射电望远镜背架结构日照温度效应实验研究  

An Experimental Research on Sunshine Temperature Effect upon the Back Structure of the 65-m Radio Telescope

作　　者：李干[1,2] 李宗春[1] 牟爱国 

机构地区：[1]中国人民解放军信息工程大学测绘学院 [2]72515部队 [3]第二炮兵驻北京专装军代室

出　　处：《天文学报》2013年第2期189-198,共10页Acta Astronomica Sinica

基　　金：中国科学院65m射电望远镜科学工程资助

摘　　要：借助精密工程测量手段,对65 m天线背架的日照温度效应进行了实验研究.在天线背架没计坐标系下分析实验数据,建立了日照温度变形模型,得出背架结构沿X方向变形系数为K_X=1.30×10^(-5),沿Z方向变形系数为K_Z=-0.44×10^(-5),沿Y方向变形偏向太阳照射一侧.根据实验数据建立的背架变形模型,模拟分析了65 m天线背架日照温度变形对面形精度的影响,得出环境温度变化1℃带来的面形精度(均方根值rms)影响分量约为0.09 mm.实验结果为65 m天线主动面调节提供了很有价值的参考数据.With the help of the precise engineering measurement, the sunshine temper- ature effect upon the back structure of the 65-m radio telescope is studied. The sunshine temperature deformation model is established by analyzing the experimental data under the designed coordinate system of the antenna＇s back structure. The results show that the coefficient of deformation along X direction is Kx = 1.30 x 10-5, along Z direction is Kz = -0.44 10-5, and along Y direction the deformation is offset to the side of sunshine. According to the deformation model based on the experimental data, the simulation analysis of the effect of sunshine temperature deformation on the surface accuracy is studied, and the results show that the 1℃ temperature difference changes the surface accuracy component about 0.09 mm. The research results provide valuable reference data for the 65-m antenna＇s active surface control.

关 键 词：望远镜 仪器 其它诸多方面 方法 分析 

分 类 号：P111[天文地球—天文学]