一种消除浮空点的多功能稳定性检测器  

A Multifunctional Stability Checker eliminating the floated nodes

作　　者：黄正峰[1] 李志杰[2] 梁华国[1] 汪静[2] 徐辉[2] 常郝[2] 

机构地区：[1]合肥工业大学电子与应用物理学院,安徽合肥230009 [2]合肥工业大学计算机与信息学院,安徽合肥230009

出　　处：《电路与系统学报》2013年第1期212-217,共6页Journal of Circuits and Systems

基　　金：国家自然科学基金资助项目(61274036;61106020;61106038);博士点基金资助项目(20110111120012)

摘　　要：随着纳米工艺的不断发展,可靠性成为集成电路设计中主要的挑战,特别是像航空,航天和军事等高科技领域。在深亚微米工艺中,老化效应和软错误是影响电路可靠性的重大因素,业界虽已对此做过研究,但是大部分都是把它们分开处理,它们中的大多数结构工作时都存在一个或多个点处于浮空态,存在严重的电荷衰减问题,尤其易受干扰,大大影响了检测结果的准确性。本文提出一种新的机制,采用一种低功耗的多功能稳定性检测器来同时解决老化,软错误和延迟故障,特别是它彻底解决了浮空点问题。利用Hspice仿真工具得到的实验结果表明该结构具有良好的性能和面积权衡,其功耗开销比参照结构节约超过35%。Along with the advance of nanometer technology,reliability has become the most important challenge in IC design,especially in some special fields,such as aviation,aerospace and the military.In ultra-deep submicron technology,aging effect and soft errors are the key factors to affect the circuit reliability.Countermeasures to avoid the reliability problem have been studied for many years.However,most are taken separately,furthermore,a lot of them have the problem existing one or more floated node in some special time window,degrading the accuracy of the detection.In this paper,a new mechanism is proposed,with a low power stability checker which can not only detect delay fault and soft errors,but also predict aging effect.Especially the checker completely solves the floated nodes problem.Experiments using Hspice show that the structure proposed in this paper can achieve a good performance–areas tradeoff and save more than 35% power consumption compared with the original one.

关 键 词：浮空态 可靠性 稳定性检测器 多功能 

分 类 号：TP302.8[自动化与计算机技术—计算机系统结构]