Defects in CdMnTe crystals for nuclear detector applications  被引量:1

Defects in CdMnTe crystals for nuclear detector applications

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作  者:杜园园 介万奇 徐亚东 郑昕 王涛 于晖 

机构地区:[1]State Key Laboratory of Solidification Processing,School of Materials Science and Engineering,Northwestern Polytechnical University

出  处:《Journal of Semiconductors》2013年第4期15-19,共5页半导体学报(英文版)

基  金:Project supported by the National Natural Science Foundations of China(Nos.50902113,50902114,61274081);the National Basic Research Program of China(No.2011CB610406);the 111 Project of China(No.B08040),the Specialized Research Fund for the Doctoral Program of Higher Education of China(No.20116102120014);NPU Foundation for Fundamental Research(No.JC20100228);the Research Fund of the State Key Laboratory of Solidification Processing,China(No.SKLSP201012)

摘  要:A laser scanning confocal microscope (LSCM) and a field-emission scanning electron microscope (FE- SEM) were used to study the defects in CdMnTe crystals, such as twin boundaries, Te inclusions, and dislocations. Twin boundaries were usually decorated with Te inclusions, which could induce dislocations. The optical, elec- trical properties and detector performance of CdMnTe crystals with twins and free of twins were compared. The results showed that the wafers with a high density of twins usually had lower average IR transmittance and poorer crystalline quality. Besides, the energy spectra indicated that twin boundaries in a CdMnTe detector had a negative effect on detector performance; the values of both the energy resolution and (μτ)e were nearly half of those for a single crystal detector.A laser scanning confocal microscope (LSCM) and a field-emission scanning electron microscope (FE- SEM) were used to study the defects in CdMnTe crystals, such as twin boundaries, Te inclusions, and dislocations. Twin boundaries were usually decorated with Te inclusions, which could induce dislocations. The optical, elec- trical properties and detector performance of CdMnTe crystals with twins and free of twins were compared. The results showed that the wafers with a high density of twins usually had lower average IR transmittance and poorer crystalline quality. Besides, the energy spectra indicated that twin boundaries in a CdMnTe detector had a negative effect on detector performance; the values of both the energy resolution and (μτ)e were nearly half of those for a single crystal detector.

关 键 词:CDMNTE twin boundary Te inclusions dislocations detector response 

分 类 号:TN303[电子电信—物理电子学]

 

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