A low noise multi-channel readout IC for X-ray cargo inspection  被引量:1

A low noise multi-channel readout IC for X-ray cargo inspection

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作  者:王旭 杨洪艳 袁颖 吴武臣 

机构地区:[1]VLSI and System Laboratory,College of Electronic Information and Control Engineering,Beijing University of Technology

出  处:《Journal of Semiconductors》2013年第4期121-126,共6页半导体学报(英文版)

基  金:Project supported by the Beijing DT Electronic Technology Co.,Ltd.;the National Natural Science Foundation of China(No.60976028)

摘  要:A low noise multi-channel readout integrated circuit (IC) which converts a detector current to analog voltage for X-ray cargo inspection is described. The readout IC provides 32 channels of a circuit having a maxi- mum dynamic range of 15 bit and is comprised of integrator gain selection, timing generator, shift register chain, integrator array, sample/hold (S/H) stage amplifier etc. and occupies a die area of 2.7 × 13.9 mm2. It operates at It was fabricated using 0.6 μm standard CMOS process, 1 MHz, consumes 100 mW from a 5 V supply and 4.096 V as reference, and has a measured output noise of 85 μVms on 63 pF of integrator gain capacitance and 440 pF of photodiode terminal capacitance so that steel plate penetration thickness can reach more than 400 mm.A low noise multi-channel readout integrated circuit (IC) which converts a detector current to analog voltage for X-ray cargo inspection is described. The readout IC provides 32 channels of a circuit having a maxi- mum dynamic range of 15 bit and is comprised of integrator gain selection, timing generator, shift register chain, integrator array, sample/hold (S/H) stage amplifier etc. and occupies a die area of 2.7 × 13.9 mm2. It operates at It was fabricated using 0.6 μm standard CMOS process, 1 MHz, consumes 100 mW from a 5 V supply and 4.096 V as reference, and has a measured output noise of 85 μVms on 63 pF of integrator gain capacitance and 440 pF of photodiode terminal capacitance so that steel plate penetration thickness can reach more than 400 mm.

关 键 词:low noise multi-channel readout IC dynamic range X-ray cargo inspection 

分 类 号:TN409[电子电信—微电子学与固体电子学]

 

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