高频大地电磁法对薄层探测能力的分析  

Detection ability analysis of the high frequency magnetotelluric method to thin layers

作　　者：戴前伟[1,2] 杨坤平[2] 王洪华[2] 

机构地区：[1]中南大学有色金属成矿预测教育部重点实验室地球科学与信息物理学院,长沙410083 [2]中南大学地球科学与信息物理学院,长沙410083

出　　处：《工程勘察》2013年第4期90-96,共7页Geotechnical Investigation & Surveying

基　　金：中南大学硕士生学位论文创新资助项目资助(2011ssxt055)

摘　　要：为了正确认识高频大地电磁法对薄层的分辨能力,本文采用一维大地电磁解析式对含有薄层的地电模型进行视电阻率计算。对有无薄层存在时相应的视电阻率曲线进行了对比分析,详细讨论了薄层物性参数发生变化时视电阻率响应特征,并计算了与无薄层存在时相应的视电阻率曲线的相对误差。根据误差的大小分析了薄层物性参数对高频大地电磁法探测能力的影响,得出了一些有实际指导意义的结论。In order to better know the resolution of high frequency magnetotelluric method to thin layers,this article adopted the analytic expression of 1-D magnetotelluric to calculate the apparent resistivity for geo-electric models with thin layers.The apparent resistivity curve is analysed of the models with and without thin layers,and the characteristics of the apparent resistivity is discussed when the parameters of thin layers changed,the relative error is calculated of the apparent resistivity curve without thin layers.Finally,based on the relative error,the influence of the parameters of the thin layers on the detection ability of the magnetotelluric method is discussed,and some valuable conclusions,which can have some guidance value to the engineering practice.

关 键 词：高频大地电磁法 薄层 正演模拟 

分 类 号：P631.325[天文地球—地质矿产勘探]