CdZnTe晶片中的Zn组分的研究  

STUDY OF Zn COMPOSITION IN CdZnTe CRYSTALS

作　　者：黄根生[1] 张小平[1] 常勇[1] 于福聚[1] 杨建荣[1] 何力[1] 

机构地区：[1]中国科学院上海技术物理研究所半导体薄膜材料研究中心和红外物理国家重点实验室,上海200083

出　　处：《红外与毫米波学报》1999年第6期460-464,共5页Journal of Infrared and Millimeter Waves

基　　金：国家自然科学基金!(编号69425002);山东大学晶体材料国家重点实验室资助

摘　　要：用X 射线双晶衍射、光致发光谱和红外透射光谱研究了CdZnTe 晶体中的Zn 的组分.研究表明透射光谱的Syllaios经验公式结果与X 射线双晶衍射和光致发光谱精确测量结果对比,偏差小于4% .透射光谱可以做为测量ZnThe X ray double crystal rocking curve measurement, photoluminescence spectra and room temperature infrared transmission spectra were used to characterize Zn composition of CdZnTe wafers. X ray double crystal rocking curve measurement and photoluminescence spectra were used to measure Zn composition accurately, and the results given by Syllaios’ equation of infrared transmission spectra are within the error of 4% of their values. The above discussions indicated that the infrared transmission spectroscopy can be used as a routine method in measuring Zn composition in CdZnTe crystals.

关 键 词：CDZNTE 光致发光谱 锌 晶片 半导体 

分 类 号：TN304.26[电子电信—物理电子学]