几种散斑图像位移测量算法的性能分析  

The Characteristics of the Various Speckle Pattern Micro-Displacement Measurement Algorithms

作　　者：赵洪杰[1] 刘大亮[1] 樊莉[1] 刘延平[1] 刘兆斌[1] 梁巨峰 穆菁[1] 

机构地区：[1]首都航天机械公司,北京100076

出　　处：《机械管理开发》2012年第2期82-83,85,共3页Mechanical Management and Development

摘　　要：基于散斑图像的微位移测量技术,利用微位移模型仿真方法,分别研究了不同噪声水平条件下Dirac法、IDFT法、MMSE1法、MMSE2法的测量精度,并从计算精度、存储资源、计算效率等角度,综合分析了各种算法的测量性能。实验结论能为工程应用提供有益参考。Based on the speckle pattern micro-displacement measurement technology and micro-displacement mode simulation methods, the measurement characteristics（the accuracy, the size of memory and the efficiency） of the various measurement algorithms, including Dirac, IDFT, MMSE1 and MMSE2, were analyzed and compared in the conditions of different noise environment, respectively. The experiment results will be benefit to the application in the engineering.

关 键 词：性能分析 微位移测量 散斑图像 

分 类 号：TP317.4[自动化与计算机技术—计算机软件与理论]