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出 处:《电子显微学报》2000年第2期113-118,共6页Journal of Chinese Electron Microscopy Society
摘 要:The intrinsic width of the energy distribution from Schottky and field emission sources is betwen 0.2 and 0.8eV.For high resolution energy loss spectroscopy,for small probe sizes in low voltage scanning electron microscopy and for sub Angstrom information transfer in transmission electron microscopy,an energy width of 50meV is needed.The development of electron filters,also called monochromators,is described.Several experimental electron microscopes with a monochromator now exist and the commericial introduction is expected soon.Initially the main application will be in studies of chemical shifts and electronic structure at nanometer resolution.The intrinsic width of the energy distribution from Schottky and field emission sources is betwen 0.2 and 0.8eV.For high resolution energy loss spectroscopy,for small probe sizes in low voltage scanning electron microscopy and for sub Angstrom information transfer in transmission electron microscopy,an energy width of 50meV is needed.The development of electron filters,also called monochromators,is described.Several experimental electron microscopes with a monochromator now exist and the commericial introduction is expected soon.Initially the main application will be in studies of chemical shifts and electronic structure at nanometer resolution.
分 类 号:TN16[电子电信—物理电子学]
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