射线推档法在西服裙中的应用  

Application of X-ray Grading Method on Tailored Skirt

作　　者：孔祥玲[1,2] 梁惠娥[2] 

机构地区：[1]江苏盐城技师学院,江苏盐城224002 [2]江南大学,江苏无锡214000

出　　处：《纺织科技进展》2013年第2期67-69,共3页Progress in Textile Science & Technology

摘　　要：通过定义服装推档法的概念,阐述了服装推档基准点和基准线的确定方法,详细介绍了西服裙的射线推档步骤,旨在为服装生产提供借鉴。The determination method of clothing grading datum point and datum line was introduced through definition of garment datum grading method. The X-ray grading step of tailored skirt was detailed to provide a reference for garments enterprise.

关 键 词：西服裙 推档 基准点 基准线 

分 类 号：TS941.26[轻工技术与工程—服装设计与工程]