缺陷关联参数红外检测Levenberg-Marquardt改进识别算法研究  

A Modified Levenberg-Marquardt Algorithm for Relevant Parameter Identification of Defect with Infrared Inspection

作　　者：吕事桂[1] 杨立[1] 范春利[1] 孙丰瑞[1] 王为清[1] 

机构地区：[1]海军工程大学动力工程学院,湖北武汉430033

出　　处：《计算物理》2013年第2期214-220,共7页Chinese Journal of Computational Physics

基　　金：国家自然科学基金(50906099)资助项目

摘　　要：对Levenberg-Marquardt(LM)算法在缺陷参数估计修正过程中无法确保参数几何关联性的局限性进行改进,并保留原算法快速收敛的特性.以二维试件内部矩形缺陷红外检测为例,采用数值实验方法比较改进前后的LM算法,分析初始假设、红外测温误差对缺陷定量识别结果的影响.数值实验表明:改进后的LM算法参数修正过程中确保了关联性的一致性;不同初始假设对缺陷识别结果的影响不大;受红外测温误差的影响,各缺陷参数之间表现出不同的识别精度.To overcome disadvantage of Levenberg-Marquardt（LM） algorithm,which can not keep geometric correlation of defect parameters,a modified method with fast convergence is presented.In a heat transfer model for a two-dimensional test piece with a subsurface rectangular defect,numerical experiments are conducted to verify effectiveness of the modified LM algorithm.Factors of initial guess and infrared temperature measurement error are considered.Conclusions are drown as follows： The modified LM algorithm keeps geometric correlation of defect parameters well and influence of initial guess is negligible;Identification accuracy of different defect parameters differs due to infrared temperature measurement errors.

关 键 词：导热反问题 LEVENBERG-MARQUARDT算法 缺陷识别 红外检测 

分 类 号：TK38[动力工程及工程热物理—热能工程]