浅地层剖面仪垂直测量性能分析  

Vertical Layer Surveying Performance Analysis for Sub-bottom Profiler

作　　者：王琪[1] 肖付民[1] 暴景阳[1] 殷晓冬[1] 徐卫明[1] 

机构地区：[1]海军大连舰艇学院海洋测绘系,辽宁大连116018

出　　处：《海洋测绘》2013年第2期30-33,共4页Hydrographic Surveying and Charting

基　　金：国家自然科学基金项目(61071006;40871207)

摘　　要：针对海道测量中浅地层剖面仪垂直测量指标模糊问题,根据声纳方程,讨论了浅地层剖面仪探测水底沉积层厚度的预报方法。分析了浅剖仪垂直地层分辨率的影响因素,并给出了垂直地层探测误差的改正方法。其结论对浅地层剖面仪实际测量作业具有指导价值。Aimed at the confusion of sub-bottom profilers＇ vertical surveying index and based on the sonar equation ,profilers＇ forecasting procedure on the thickness of marine sediments is discussed. Effects on the vertical layer resolution are analysed. The method is derived to correct the error of surveying marine sediments＇ thickness. The analysis and conclusion made in this article will be instructive in offshore engineering practice.

关 键 词：浅地层剖面仪 海底探测 性能分析 参数改正 

分 类 号：P204[天文地球—测绘科学与技术]