High-precision two-dimensional atom localization via probe absorption in an M-scheme atomic system  

High-precision two-dimensional atom localization via probe absorption in an M-scheme atomic system

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作  者:吴建春 刘正东 郑军 

机构地区:[1]Institute of Modern Physics, Nanchang University [2]Engineering Research Center for Nanotechnology, Nanchang University

出  处:《Chinese Physics B》2013年第4期264-267,共4页中国物理B(英文版)

基  金:Project supported by the National Natural Science Foundation of China (Grant Nos. 60768001 and 10464002)

摘  要:In the present paper, we investigate the behavior of two-dimensional atom localization in a five-level M-scheme atomic system driven by two orthogonal standing-wave fields. We find that the precision and resolution of the atom localization depends on the probe field detuning significantly. And because of the effect of the microwave field, an atom can be located at a particular position via adjusting the system parameters.In the present paper, we investigate the behavior of two-dimensional atom localization in a five-level M-scheme atomic system driven by two orthogonal standing-wave fields. We find that the precision and resolution of the atom localization depends on the probe field detuning significantly. And because of the effect of the microwave field, an atom can be located at a particular position via adjusting the system parameters.

关 键 词:two-dimensional atom localization probe absorption 

分 类 号:O562[理学—原子与分子物理]

 

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