高Q腔法与准光腔法用于毫米波段室温介电性能测试比对研究  

Comparison of High Q Cavity Method and Quasi-Optical Resonator Method Used in Dielectric Properties Testing at Millimeter Wave Band

作　　者：陈聪慧[1] 何凤梅[1] 李恩[2] 杨景兴[1] 

机构地区：[1]航天材料及工艺研究所,先进功能复合材料技术重点实验室,北京100076 [2]电子科技大学,成都610054

出　　处：《宇航材料工艺》2013年第2期99-101,共3页Aerospace Materials & Technology

摘　　要：介绍了用于毫米波段的介电性能测试的高Q腔法和准光腔法的原理及物理模型,并分别对其进行了仿真分析,建立了相应的测试装置,进行了空腔和石英玻璃的测试。结果表明,准光腔法要比高Q腔法在品质因数、可分辨的频点、样品尺寸、测试精度等方面更有优势。Theory and physical model of high Q cavity method and quasi-optical resonator method used in die- lectric properties testing at millimeter wave band was introduced and emulation analyzed. Test setups were built. Tests of cavum and quartz glass were carried out. Result show that quasi-optical resonator method is better than high Q cavi- ty method at quality factor, distinguish frequency point, sample size and testing precision.

关 键 词：高Q腔法 准光腔法 毫米波段 介电性能 

分 类 号：V448.222[航空宇航科学与技术—飞行器设计]