PVDF压电系数d_(31)受温度影响的试验测定  

Measurement of Piezoelectric Coefficient d_(31) of PVDF Thin Films at Different Temprature

作　　者：余尚江[1] 杨吉祥[1] 陈晋央[1] 陈显[1] 

机构地区：[1]总参工程兵科研三所,河南洛阳471023

出　　处：《压电与声光》2013年第2期255-257,共3页Piezoelectrics & Acoustooptics

摘　　要：为获得PVDF薄膜压电系数d31在不同温度时的值,采用了准静态拉伸的直接测量技术。简要介绍了准静态拉伸的测量方法及其试验装置,给出了试验结果。通过试验,精确地测定了PVDF在温度范围为-20～+70℃内压电系数d31的值,同时试验也表明,准静态拉伸测量薄膜压电特性的试验方法简单可靠,测量结果合理。In order to obtain piezoelectric coefficient of d31 PVDF film, a new quasistatic stretching direct meas- urement method was uesd. The tester and measurement results were presented in this paper. The values of piezoe- lectric coefficient d31 of PVDF film were more exactly measured at the temperature from --20- ＋ 70 ℃ during the test. The experiment also showed that the quasistatic stretching method for measuring piezoelectric coefficient of film is reliable and simple and the measuring results were reasonable and accurate.

关 键 词：PVDF 压电系数 d31 测量方法 

分 类 号：O4-34[理学—物理] TB971[一般工业技术—计量学]