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作 者:梅超[1,2] 周泗忠[1] 张恒金[1] 段晶[1] 姜凯[1,2]
机构地区:[1]中国科学院西安光学精密机械研究所,陕西西安710119 [2]中国科学院大学,北京100049
出 处:《光学学报》2013年第4期64-67,共4页Acta Optica Sinica
摘 要:在光学设计时应尽量避免鬼像的产生,所以快速、准确地进行鬼像分析就显得尤为重要。提出利用Code V和Tracepro软件对光学系统中的鬼像进行仿真分析,用Code V确定会产生严重鬼像的光学工作面;将光学系统在Tracepro中建模,在物面取不同的位置设为点光源,分别对每个点光源进行分析。分析时可利用表面属性设置限制产生鬼像的工作面,并利用阈值设置限制鬼像的阶数,最终获取一阶鬼像相对位置,以及其和正常像之间的能量大小、分布关系。During optical designing, ghost images of optical system should be avoided, so fast and precise analysis of ghost images appears to be very important. The way of first-order ghost-image analysis of imaging system based on Code V and Tracepro is proposed. The surfaces which can cause serious ghost image are found out. The optical system model is established in Tracepro. The image is separated into several parts. Different parts are setted as different spot sources, then, the spot sources are analyzed one by one. During analysis, the order of the ghost is controlled by threshold and ghost-surface is controlled by the surface property. Through analysis, the position of ghost image, and power distribution of ghost image can be obtained.
分 类 号:TN214[电子电信—物理电子学]
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