大规格异形紧压导体直流电阻的测试  

The DC Resistance Testing of Large Size Abnomal-Shaped Compact Conductor

作　　者：金金元 

机构地区：[1]浙江晨光电缆股份有限公司,浙江平湖314204

出　　处：《光纤与电缆及其应用技术》2013年第2期11-13,共3页Optical Fiber & Electric Cable and Their Applications

摘　　要：主要对采用常规的侧面电流输入法测试大规格异形紧压导体直流电阻易产生测试误差的原因进行了分析,进而创新了一种导体直流电阻端面电流输入测试新技术。并利用数据对比分析了这两种测试方法,结果显示采用端面电流输入法的大规格异形紧压导体直流电阻的测试数据更稳定、更真实。The reasons that the testing in DC resistance of large size abnomal-shaped compact conductor is easy to produce testing error when conventional side current input method is used are analyzed. Furthermore a new testing technology for conductor DC resistance using end current input test technology is innovated. These two methods are compared and analyzed using data, the results show that the end current input method is more stable and exact in the testing data of the DC resistance of large size abnomal-shaped compact conductor.

关 键 词：异形导体 侧面电流输入 端面电流输入 夹具 误差 

分 类 号：TM247[一般工业技术—材料科学与工程]