高速高分辨率ADC有效位测试方法研究  

Research on the ENOB test methods of high-speed high-resolution ADC

作　　者：李海涛[1] 李斌康[1] 阮林波[1] 田耕[1] 田晓霞[1] 渠红光[1] 王晶[1] 张雁霞[1] 

机构地区：[1]西北核技术研究所强脉冲辐射环境模拟与效应国家重点实验室,陕西西安710024

出　　处：《电子技术应用》2013年第5期41-43,共3页Application of Electronic Technique

摘　　要：介绍了ADC的有效位计算公式,分析了ADC的性能参数测试方法,给出了ADC的有效位测试解决方案。对FFT方法在ADC性能测试中的应用做了深入探讨,包括频谱泄露、相干采样和加窗函数等。采用一种改进的FFT方法对TI公司的ADS5400进行有效位测试,得到其在400 MS/s采样率的有效位ENOB=9.12 bit(fin=1.123 MHz)。The performance parameters of ADC, especially the ENOB, are introduced in the paper. After the discussion of sev-eral test methods of ADC performance parameter, a test solution for ENOB is put forward. The application of the FFT method in the ENOB test is analyzed, including spectral leakage, coherent sampling and windowing functions, etc. An improved FFF methods is used in the ADC ENOB test, and the ENOB of ADS5400 working at 400 MS/s is 9.12 bit（fin=1.123 MHz）.

关 键 词：ADC有效位 FFT ADS5400 

分 类 号：TM930.1[电气工程—电力电子与电力传动]