基于VIIS-EM平台的虚拟数字集成电路测试仪的设计  

Design of a virtual digital integrated circuits testing system based on VIIS-EM platform

作　　者：尹超平[1] 张秉仁[1] 赵吉祥[1] 

机构地区：[1]吉林大学仪器科学与电气工程学院,吉林长春130026

出　　处：《电子技术应用》2013年第5期89-92,共4页Application of Electronic Technique

摘　　要：基于模块化虚拟仪器的设计思想,设计出一种以VIIS-EM平台为核心,以LabVIEW为工具进行图形化编程的虚拟数字集成电路测试仪,并论述了其实现方案。重点分析了硬件电路的搭建思路和软件的控制流程,最后给出虚拟数字集成电路测试仪的测试结果。According to the concept of the modularization virtual instrument, this paper has designed a kind of Digital Inte-grated Circuits Testing System and discussed its realization scheme. It uses VIIS-EM platform as the core of the instrument and LabVIEW as the programming tool in the computer. It specifically analyzed the construction of hardware and software control flow. It gives the actual signal test results in the end.

关 键 词：虚拟仪器 VIIS—EM LABVIEW 数字集成电路 

分 类 号：TN407[电子电信—微电子学与固体电子学]