像差校正电镜和材料界面的精细原子构型与其特性——第82期“双清论坛”综述  

ABERRATION-CORRECTED TRANSMISSION ELECTRON MICROSCOPE,ATOMIC HYPERFINE STRUCTURE AND CHARACTERISTICS OF MATERIALS INTERFACE——Summary of 82th Shuangqing Forum

作　　者：于荣[1] 杜奎[2] 杨志卿[2] 钟虓 郑雁军[3] 车成卫[3] 

机构地区：[1]清华大学材料系,北京100083 [2]中国科学院金属研究所沈阳材料科学国家(联合)实验室,沈阳110016 [3]国家自然科学基金委员会工程与材料科学部,北京100085

出　　处：《中国科学基金》2013年第3期129-132,153,共5页Bulletin of National Natural Science Foundation of China

摘　　要：像差校正电镜的出现,使人们可以从亚埃的尺度观察材料结构,从而可能给材料研究带来重大改变。以此为背景,第82期双清论坛"走向亚埃世界:材料界面工程中精细原子构型与其特性"于2012年10月21—23日在北京召开,来自国内外23个大学和科研院所的38名专家参加了这次论坛。论坛就球差矫正电镜的发展及其在材料结构观察和界面调制中的应用问题展开了热烈的讨论,凝练出了该领域的关键科学问题,对领域内需要重点发展及优先资助的方向提出了建议。Aberration-corrected transmission electron microscope offers for the first time the materials re- searchers a possibility for characterizing materials structure at a sub-angstrom resolution level. This may bring important changes in materials science. Under this background, the 82nd Shuangqing Forum was held during 21st-23rd, October 2012 in Beijing, themed as Walk into a sub-angstrom world： atomic hyper- fine structure and characteristics in materials interface engineering＂. Thirty-eight experts and scholars from 23 universities and research institutions, both from domestic and abroad, attended the forum. The topics include the developments of Aberration-corrected transmission electron microscope, and its application in the observation and modulation of materials interface. After a lively discussion, the forum reached summa- rization of the key scientific issues of the field, and suggested highlights in the further Funding scheme.

关 键 词：透射电子显微镜 像差校正 材料科学 

分 类 号：TB30[一般工业技术—材料科学与工程]